Current Status of the Sub-Angstrom Low-Voltage Electron Microscopy (SALVE) Project

Thermal diffuse scattering in sub-angstrom quantitative electron microscopy-phenomenon, effects and approaches.

This paper reviews the recent progress in the following areas. (1) In quantitative high-resolution transmission electron microscopy, the theoretically calculated images usually give better contrast than the experimentally observed ones although all of the factors have been accounted for. This discrepancy is suggested due to thermal diffusely scattered (TDS) electrons, which were not included in...

Sub-Angstrom Edge Relaxations Probed by Electron Microscopy in Hexagonal Boron Nitride (h-BN)

Contrast transfer and resolution limits for sub-angstrom high-resolution transmission electron microscopy.

The optimum imaging of an object structure at the sub-angstrom length scale requires precise adjustment of the lens aberrations of a high-resolution instrument up to the fifth order. A least-squares optimization of defocus aberration C1, third-order spherical aberration C3, and fifth-order spherical aberration C5 yields two sets of aberration coefficients for strong phase contrast up to the inf...

Foreword to the special issue low-voltage electron microscopy.

Today, low voltage electron microscopy is a topic of high relevance all over the world; in Japan [1], America [2], and Germany [3] particular research projects are even dedicated to unravel the atomic and electronic structure of radiation sensitive matter with 60 kV electrons and below. It seems that research comes back to its voltage-routes of the early days of electron microscopy, when in 193...

The Critical Voltage Effect in High-Voltage Electron' Microscopy